Binciken microstructure da kimanta kayan semiconductor
Gabatarwar Sabis
Tare da ci gaba da ci gaba da haɓaka manyan hanyoyin haɗin gwiwa, tsarin masana'antar guntu yana ƙara haɓaka, kuma ƙananan ƙananan ƙwayoyin cuta da abubuwan da ke tattare da semiconductor suna hana haɓaka yawan amfanin guntu, wanda ke kawo ƙalubale mai girma ga aiwatar da sabbin na'urori masu ƙarfi da haɗin gwiwar fasahar kewayawa.
GRGTEST yana ba da cikakken bincike na microstructure na kayan aikin semiconductor da kimantawa don taimakawa abokan ciniki haɓaka semiconductor da hanyoyin haɗin kai, gami da shirye-shiryen bayanin martabar wafer da bincike na lantarki, cikakken bincike na zahiri da sinadarai na kayan masana'antar semiconductor, ƙira da aiwatar da shirin nazarin gurɓataccen abu.
Iyakar sabis
Semiconductor kayan, Organic kananan kwayoyin kayan, polymer kayan, Organic / inorganic matasan kayan, inorganic wadanda ba karfe kayan
Shirin sabis
1. Chip wafer matakin bayanin martaba shirye-shiryen da nazarin lantarki, dangane da mayar da hankali ga fasahar ion beam (DB-FIB), daidaitaccen yanki na yanki na guntu, da kuma hotunan lantarki na ainihi, na iya samun tsarin bayanan guntu, abun da ke ciki da sauran mahimman bayanai na tsari;
2. M bincike na jiki da kuma sinadaran Properties na semiconductor masana'antu kayan, ciki har da Organic polymer kayan, kananan kwayoyin kayan, inorganic wadanda ba karfe kayan abun da ke ciki analysis, kwayoyin tsarin bincike, da dai sauransu.;
3. Ƙirƙiri da aiwatar da tsarin bincike na gurɓataccen abu don kayan semiconductor. Zai iya taimaka wa abokan ciniki dalla-dalla su fahimci halaye na zahiri da sinadarai na gurɓatawa, gami da: nazarin abubuwan da ke tattare da sinadarai, nazarin abubuwan da ke ciki, nazarin tsarin kwayoyin halitta da sauran nazarin halaye na zahiri da sinadarai.
Abubuwan Sabis
| Sabisnau'in | Sabisabubuwa |
| Binciken abun da ke ciki na kayan semiconductor | l EDS elemental bincike, l X-ray photoelectron spectroscopy (XPS) nazari na farko |
| Binciken tsarin kwayoyin halitta na kayan semiconductor | l FT-IR infrared bakan bincike, l X-ray diffraction (XRD) spectroscopic bincike, l Nukiliya Magnetic rawa pop Analysis (H1NMR, C13NMR) |
| Binciken microstructure na kayan semiconductor | l Biyu mayar da hankali ion katako (DBFIB) yanki bincike, l An yi amfani da sikanin sikanin microscopy na fili (FESEM) don aunawa da lura da ƙananan ƙwayoyin cuta, l Atomic Force microscopy (AFM) don lura da yanayin halittar jiki |
-
Waya
-
Imel
-
Sama