Binciken microstructure da kimanta kayan semiconductor
Gabatarwar Sabis
Tare da ci gaba da ci gaba da ci gaba da manyan da'irori masu haɗaka, tsarin masana'anta na guntu yana ƙara zama mai rikitarwa, kuma ƙananan microstructure da abun da ke ciki na kayan aikin semiconductor suna hana haɓaka yawan amfanin guntu, wanda ke kawo babban kalubale ga aiwatar da sabon semiconductor da haɗin gwiwa. fasahar kewayawa.
GRGTEST yana ba da cikakken bincike na microstructure na kayan aikin semiconductor da kimantawa don taimakawa abokan ciniki haɓaka semiconductor da haɓaka hanyoyin da'ira, gami da shirye-shiryen bayanin martabar wafer da bincike na lantarki, cikakken bincike na zahiri da sinadarai na kayan masana'antar semiconductor, ƙira da aiwatar da bincike na gurɓataccen abu. shirin.
Iyakar sabis
Semiconductor kayan, Organic kananan kwayoyin kayan, polymer kayan, Organic / inorganic matasan kayan, inorganic wadanda ba karfe kayan
Shirin sabis
1. Chip wafer matakin bayanin martaba shirye-shiryen da nazarin lantarki, dangane da mayar da hankali ga fasahar ion beam (DB-FIB), daidaitaccen yanki na guntu, da kuma hoton lantarki na ainihi, na iya samun tsarin bayanan guntu, abun da ke ciki da sauran su. mahimman bayanai na tsari;
2. M bincike na jiki da kuma sinadaran Properties na semiconductor masana'antu kayan, ciki har da Organic polymer kayan, kananan kwayoyin kayan, inorganic wadanda ba karfe kayan abun da ke ciki analysis, kwayoyin tsarin bincike, da dai sauransu.;
3. Ƙirƙiri da aiwatar da tsarin bincike na gurɓataccen abu don kayan semiconductor.Zai iya taimaka wa abokan ciniki dalla-dalla su fahimci halaye na zahiri da sinadarai na gurɓatawa, gami da: nazarin abubuwan da ke tattare da sinadarai, nazarin abubuwan da ke ciki, nazarin tsarin kwayoyin halitta da sauran nazarin halaye na zahiri da sinadarai.
Abubuwan Sabis
| Sabisnau'in | Sabisabubuwa |
| Binciken abun da ke ciki na kayan semiconductor | l EDS elemental bincike, l X-ray photoelectron spectroscopy (XPS) nazari na farko |
| Binciken tsarin kwayoyin halitta na kayan semiconductor | l FT-IR infrared bakan bincike, l X-ray diffraction (XRD) spectroscopic bincike, l Nukiliya Magnetic rawa pop Analysis (H1NMR, C13NMR) |
| Binciken microstructure na kayan semiconductor | l Biyu mayar da hankali ion katako (DBFIB) yanki bincike, l An yi amfani da sikanin sikanin microscopy na fili (FESEM) don aunawa da lura da ƙananan ƙwayoyin cuta, l Atomic Force microscopy (AFM) don lura da yanayin halittar jiki |
