DB-FIB

Tare da saurin ci gaba na na'urorin lantarki na semiconductor da fasahar da'irar haɗin gwiwar, haɓakar na'urar da sifofin da'ira sun ɗaga buƙatun don binciken tsarin guntu na microelectronic, ƙididdigar gazawa, da ƙirƙira micro/nano.Dual Beam FIB-SEM tsarin, tare da madaidaicin mashin ɗinsa mai ƙarfi da ƙarfin bincike na microscopic, ya zama ba makawa a ƙirar microelectronic da masana'anta.

Dual Beam FIB-SEM tsarinYana haɗa duka biyun Mayar da hankali Ion Beam (FIB) da na'urar duba microscope (SEM). Yana ba da damar kallon SEM na ainihin-lokaci na tsarin micromachining na tushen FIB, yana haɗa babban ƙudurin sararin samaniya na katako na lantarki tare da madaidaicin ikon sarrafa kayan aiki na katako na ion.